Fee Details:

14396: Helios - Dual Beam Instrument FIB Nanometer Cutting Tool

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
No
External:
Yes
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$330.00/Hour
Submitted By:
LaRae Wallace
Requester:
Peter Eschbach
Updated:
4/16/2021
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

History:

14396: Helios - Dual Beam Instrument FIB Nanometer Cutting Tool

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
No
External:
Yes
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$330.00/Hour
Submitted By:
LaRae Wallace
Requester:
Updated:
5/4/2020
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14396: Helios - Dual Beam Instrument FIB Nanometer Cutting Tool

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
No
External:
Yes
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$310.00/Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
3/26/2019
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14396: Helios - Dual Beam Instrument FIB Nanometer Cutting Tool

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
No
External:
Yes
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$310.00/Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
3/19/2018
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14396: Helios - Dual Beam Instrument FIB Nanometer Cutting Tool

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
No
External:
Yes
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$310.00/Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
3/13/2017
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14396: Helios - Dual Beam Instrument FIB Nanometer Cutting Tool

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
No
External:
Yes
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$270.00/Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
2/19/2016
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14396: Helios - Dual Beam Instrument FIB Nanometer Cutting Tool

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
No
External:
Yes
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$270.00/Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
5/20/2015
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

14396: Helios - Dual Beam Instrument FIB Nanometer Cutting Tool

The Helios is a nanofabrication machine and imaging tool. The nanofabrication occures with a focused beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it can not be seen with the naked eye or an optical microscope. The FIB is for milling and scanning electron beam for imaging.
Unit:
Centers & Institutes - Research
Department:
Interdptl Electron Microscopy
Category:
Electron Microscopy
Internal:
No
External:
Yes
Banner Index:
RDR387
Fund:
090022
Org:
154060
Program:
99100
Activity:
Amount:
$270.00/Per Hour
Submitted By:
Wendy Fekkers
Requester:
Updated:
5/20/2015
Banner Index Title:
RDR - Electron Microscopy Svc Ctr
Fund Title:
RDR - Electron Microscopy Svc Ctr
Org Title:
RDR - Interdptl Electron Microscopy
Program Title:
Service Departments
Activity Title:

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