14444:
Helios - Rate with Ion Beam
Helios - Rate with Ion Beam. Internal Fee
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$114.00/Hour
- Submitted By:
-
LaRae Wallace
- Requester:
-
- Updated:
-
4/16/2021
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$112.00/Hour
- Submitted By:
-
LaRae Wallace
- Requester:
-
- Updated:
-
6/15/2020
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$76.00/Hour
- Submitted By:
-
Meghan Tompkins
- Requester:
-
- Updated:
-
6/27/2019
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$76.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
5/7/2018
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$72.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
2/23/2017
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$72.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
2/19/2016
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$72.00/Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
5/23/2015
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|
14444:
Helios - Dual Beam Instrument FIB & SEM Nanometer Cutting Tool & Imaging
The Helios is a nanofabrication machine and imaging tool. The nanofabrication occurs with a focused ion beam (FIB) of diameter 4.5 nano meters. The cuts are scanned across a material to form a nano machined part. The nano machined part is so small it cannot be seen with naked eye or an optical microscope so the need for a built electron beam. Thus, the name dual beam : focused ion beam for milling and scanning electron beam for imaging. Parts fabricated on a Helios include nanometer sized detector arrays for sensors, waveguides for bending and manipulating light for telecommunications , and nanometer sized electrical devices.
- Unit:
-
Centers & Institutes - Research
- Department:
-
Interdptl Electron Microscopy
- Category:
-
Electron Microscopy
- Internal:
-
Yes
- External:
-
No
- Banner Index:
-
RDR387
- Fund:
-
090022
- Org:
-
154060
- Program:
-
99100
- Activity:
-
- Amount:
-
$72.00/Per Hour
- Submitted By:
-
Wendy Fekkers
- Requester:
-
- Updated:
-
5/23/2015
- Banner Index Title:
-
RDR - Electron Microscopy Svc Ctr
- Fund Title:
-
RDR - Electron Microscopy Svc Ctr
- Org Title:
-
RDR - Interdptl Electron Microscopy
- Program Title:
-
Service Departments
- Activity Title:
-
|